Failure Analysis Market by Equipment (Optical Microscope, SEM, TEM, FIB, Scanning Probe Microscope, Dual Beam), Technology (SIMS, EDX, CMP, FIB, BIM, RIE), Application, & Geography - Forecast to 2025

故障解析の世界市場予測:装置別(光学顕微鏡、SEM、TEM、FIB、走査型プローブ顕微鏡、デュアルビーム)、技術別(SIMS、EDX、CMP、FIB、BIM、RIE)、用途別、地域別

◆タイトル:Failure Analysis Market by Equipment (Optical Microscope, SEM, TEM, FIB, Scanning Probe Microscope, Dual Beam), Technology (SIMS, EDX, CMP, FIB, BIM, RIE), Application, & Geography - Forecast to 2025
◆商品コード:SE 3529
◆調査・発行会社:MarketsandMarkets
◆発行日:2020年5月20日
◆ページ数:165
◆レポート形式:PDF / 英語
◆納品方法:Eメール(受注後24時間以内)
◆調査対象地域:グローバル
◆産業分野:半導体
◆販売価格オプション(消費税別)
Single User(1名様閲覧)USD4,950 ⇒換算¥519,750見積依頼/購入/質問フォーム
Multi User (Five User)USD6,650 ⇒換算¥698,250見積依頼/購入/質問フォーム
Corporate License (全社内共有可)USD8,150 ⇒換算¥855,750見積依頼/購入/質問フォーム
販売価格オプションの説明はこちらでご利用ガイドはこちらでご確認いただけます。
※お支払金額は「換算金額(日本円)+消費税+配送料(Eメール納品は無料)」です。
※Eメールによる納品の場合、通常ご注文当日~2日以内に納品致します。
※商品の納品後、納品日+5日以内に請求書を発行し、お客様宛に郵送いたしますので、請求書発行日より2ヶ月以内に銀行振込にて支払をお願いします。(振込先:三菱東京UFJ銀行/京橋支店/H&Iグローバルリサーチ株式会社)
※上記の日本語題名はH&Iグローバルリサーチが翻訳したものです。英語版原本には日本語表記はありません。
※為替レートは適宜修正・更新しております。リアルタイム更新ではありません。
※ご購入後、レポートに記載の英語表現や単語の意味に関しましては無料でお答えいたします。(但し、対応範囲は弊社で判断)
※弊社H&Iグローバルリサーチ株式会社はMarketsandMarketsの日本における正規販売代理店です。

【レポートの概要】

MarketsandMarkets社は故障解析の世界市場が2020年39億ドルから2025年59億ドルまで、年平均8.3%成長すると予測しています。本調査レポートでは、故障解析の世界市場を詳細に調査・分析し、イントロダクション、調査手法、エグゼクティブサマリー、プレミアムインサイト、市場概要、機器別(光学顕微鏡、走査型電子顕微鏡(SEM)、送信電子顕微鏡(TEM)、走査型プローブ顕微鏡(SPM)、集束イオンビーム(FIB)システム、デュアルビームシステム、その他)、技術別(エネルギー分散型X線分光法(EDX)、二次イオン質量分析(SIMS)、集中型イオンビーム(FIB)、広幅イオンミリング(BIM)、反応性イオンエッチング(RIE)、走査型プローブ顕微鏡(SPM)、その他)、用途別(電子&半導体、産業科学、材料科学、生命科学)、地域別、競争状況、企業概要などを含め、ご提供いたします。
・イントロダクション
・調査手法
・エグゼクティブサマリー
・プレミアムインサイト
・市場概要
・故障解析の世界市場:機器別(光学顕微鏡、走査型電子顕微鏡(SEM)、送信電子顕微鏡(TEM)、走査型プローブ顕微鏡(SPM)、集束イオンビーム(FIB)システム、デュアルビームシステム、その他)
・故障解析の世界市場:技術別(エネルギー分散型X線分光法(EDX)、二次イオン質量分析(SIMS)、集中型イオンビーム(FIB)、広幅イオンミリング(BIM)、反応性イオンエッチング(RIE)、走査型プローブ顕微鏡(SPM)、その他)
・故障解析の世界市場:用途別(電子&半導体、産業科学、材料科学、生命科学)
・故障解析の世界市場:地域別
・競争状況
・企業概要

“The failure analysis market is projected to grow at a CAGR of 8.3% from 2020 to 2025″
The failure analysis market is estimated to be valued at USD 3.9 billion in 2020 and is projected to reach USD 5.9 billion by 2025; it is expected to grow at a CAGR of 8.3% from 2020 to 2025. A few key factors driving the growth of this market include imposition of safety rules & regulations by governments and international bodies, rise in demand for failure analysis from the electronics & semiconductor industry, technological advancements in microscopes, and rising focus on nanotechnology and regenerative medicine.
“Energy Dispersive X-Ray Spectroscopy (EDX) technology expected to hold the largest share of failure analysis market during the forecast period”
Energy Dispersive X-Ray Spectroscopy (EDX) technology is expected to hold the largest share of failure analysis market during the forecast period. This growth is anticipated due to the integration of EDX with failure analysis equipment such as Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), and Scanning Transmission Electron Microscopy (STEM). EDX is widely used as an attachment for elemental analysis.

“Focused Ion Beam System of the failure analysis market projected to grow at the highest CAGR of during the forecast period”
Focused Ion Beam System (FIB) of the failure analysis market projected to grow at the highest CAGR of during the forecast period. FIBs are primarily used for semiconductor manufacturing. The development of commercially focused FIBs has led to their increased applications in the field of material sciences. In addition to circuit editing and Transmission Electron Microscopy (TEM) sample preparation, FIBs can now be used for microstructural analysis and prototyping nanomachining. The fastest growth of this segment can be attributed to the growing adoption of FIB systems in material science and bioscience applications.

“Failure analysis market in APAC is expected to grow at the highest CAGR during the forecast period”
Failure analysis market in APAC is expected to grow at the highest CAGR during the forecast period. This growth is attributed to opportunities in emerging economies such as India and China, establishment of collaboration centers for microscopy research, and increasing applications of correlative microscopy in life sciences and nanotechnology research in this region.
Breakdown of the profile of primary participants:
• By Company Type: Tier 1 – 55 %, Tier 2 – 20%, and Tier 3 – 25%
• By Designation: C-Level Executives – 35%, Directors – 25%, Others – 40%
• By Region: North America – 10%, Europe – 20%, APAC – 40%, and RoW – 30%
Thermo Fisher Scientific, Inc. (US), Hitachi High-Technologies Corporation (Japan), Carl Zeiss (Germany), JOEL, Ltd. (Japan), TESCAN OSRAY HOLDING (Czech Republic), Bruker (US), Semilab (Hungary), A&D Company, Ltd. (Japan), HORIBA, Ltd. (Japan), Leica Microsystems GmbH (Germany), Veeco Instruments (US), Oxford Instruments (UK), and Eurofins Scientific (Luxembourg) are among a few major players in the failure analysis market.

Research Coverage
The failure analysis market has been segmented, based on equipment, into Optical Microscope, Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Scanning Probe Microscope, Focused Ion Beam System (FIB), Dual Beam System (FIB-SEM) and others (X-ray microscopes, Raman microscopes, and scanning acoustic microscopes). Based on technology, the failure analysis market is segmented into Energy Dispersive X-Ray Spectroscopy (EDX), Secondary Ion Mass Spectrometry (SIMS), Focused Ion Beam (FIB), Broad Ion Milling (BIM), Relative Ion Etching (RIE), Scanning Probe Microscopy (SPM) and Others (Chemical Mechanical Planarization (CMP) and X-ray Photoelectron Spectroscopy (XPS)). Based on application failure analysis market has been segmented into electronics & semiconductor, industrial science, material science, and bioscience. On the basis of geographic regions, the failure analysis market has been classified into North America, Europe, Asia Pacific (APAC), and Rest of the World (RoW).
Reasons to Buy the Report
The report would help market leaders/new entrants in the following ways:
1. This report segments the failure analysis market comprehensively and provides the closest approximations of the overall market’s size, as well as that of the subsegments across different equipment, technologies, applications, and regions.
2. The report helps stakeholders understand the pulse of the market and provides information on key market drivers, restraints, challenges, and opportunities.
3. This report would help stakeholders understand their competitors better and gain more insights to enhance their position in the business. The competitive landscape section includes competitive leadership mapping, product launches, product developments, agreements, acquisitions, collaborations, and partnerships in the failure analysis market.

【レポートの目次】

TABLE OF CONTENTS
1 INTRODUCTION (Page No. – 19)
1.1 STUDY OBJECTIVES
1.2 MARKET DEFINITION AND SCOPE
1.2.1 INCLUSIONS AND EXCLUSIONS
1.3 STUDY SCOPE
1.3.1 MARKETS COVERED
1.3.2 GEOGRAPHIC SCOPE
1.4 YEARS CONSIDERED
1.5 CURRENCY
1.6 LIMITATIONS
1.7 STAKEHOLDERS
1.8 SUMMARY OF CHANGES
2 RESEARCH METHODOLOGY (Page No. – 23)
2.1 RESEARCH DATA
2.1.1 SECONDARY DATA
2.1.1.1 Secondary sources
2.1.2 PRIMARY DATA
2.1.2.1 Primary sources
2.1.2.2 Breakdown of primary interviews
2.1.3 SECONDARY AND PRIMARY RESEARCH
2.2 MARKET SIZE ESTIMATION
2.2.1 BOTTOM-UP APPROACH
2.2.1.1 Approach for capturing market size using bottom-up analysis (demand side)
2.2.2 TOP-DOWN APPROACH
2.2.2.1 Approach for capturing market share using top-down analysis (supply side)
2.3 DATA TRIANGULATION
2.4 ASSUMPTIONS
3 EXECUTIVE SUMMARY (Page No. – 32)
4 PREMIUM INSIGHTS (Page No. – 36)
4.1 ATTRACTIVE OPPORTUNITIES IN THE FAILURE ANALYSIS MARKET
4.2 MARKET IN ASIA PACIFIC, BY EQUIPMENT AND APPLICATION
4.3 MARKET, BY TECHNOLOGY
4.4 MARKET, BY GEOGRAPHY
5 MARKET OVERVIEW (Page No. – 39)
5.1 INTRODUCTION
5.2 MARKET DYNAMICS
5.2.1 DRIVERS
5.2.1.1 Imposition of safety rules and regulations by governments and international bodies
5.2.1.2 Rise in demand for failure analysis from the electronics & semiconductor industry
5.2.1.3 Technological advancements in microscopes
5.2.1.4 Rising focus on nanotechnology and regenerative medicine
5.2.2 RESTRAINTS
5.2.2.1 High ownership and maintenance cost
5.2.3 OPPORTUNITIES
5.2.3.1 Increasing demand for failure analysis in developing countries
5.2.3.2 Integration of microscopy with spectroscopy
5.2.3.3 Use of focused ion beam systems to study biological samples and biomaterials
5.2.4 CHALLENGES
5.2.4.1 Dearth of skilled professionals
5.3 VALUE CHAIN ANALYSIS
5.4 COVID-19 IMPACT ON FAILURE ANALYSIS MARKET
6 FAILURE ANALYSIS MARKET, BY EQUIPMENT (Page No. – 48)
6.1 INTRODUCTION
6.2 OPTICAL MICROSCOPE
6.2.1 HIGH ADOPTION OF OPTICAL MICROSCOPES FOR LOCATING AND IDENTIFYING EXTERNAL DEFECTS TO DRIVE THE MARKET
6.3 SCANNING ELECTRON MICROSCOPE (SEM)
6.3.1 INCREASING ADOPTION OF SCANNING ELECTRON MICROSCOPES IN VARIOUS INDUSTRIES SUCH AS MATERIAL SCIENCE AND SEMICONDUCTORS TO DRIVE THE MARKET
6.4 TRANSMISSION ELECTRON MICROSCOPE (TEM)
6.4.1 HIGH ADOPTION OF TRANSMISSION ELECTRON MICROSCOPES FOR LIFE SCIENCE, MATERIAL SCIENCE, AND METALLURGY TO DRIVE THE MARKET
6.5 SCANNING PROBE MICROSCOPE (SPM)
6.5.1 INCREASING DEMAND FOR ATOMIC FORCE MICROSCOPY FROM MINIATURE ELECTRONIC AND SEMICONDUCTOR DEVICES IS DRIVING THE MARKET
6.6 FOCUSED ION BEAM (FIB) SYSTEM
6.6.1 MARKET FOR FOCUSED ION BEAM SYSTEMS IS EXPECTED TO GROW AT THE HIGHEST CAGR DURING THE FORECAST PERIOD
6.7 DUAL BEAM SYSTEM
6.7.1 MARKET FOR DUAL BEAM SYSTEMS IS EXPECTED TO GROW AT THE SECOND HIGHEST CAGR DURING FORECAST PERIOD
6.8 OTHERS
7 FAILURE ANALYSIS MARKET, BY TECHNOLOGY (Page No. – 70)
7.1 INTRODUCTION
7.2 ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDX)
7.2.1 EDX CAN BE COUPLED WITH SEM, TEM, AND STEM TECHNOLOGIES, WHICH IS LIKELY TO DRIVE THE DEMAND FOR THIS TECHNOLOGY
7.3 SECONDARY ION MASS SPECTROSCOPY (SIMS)
7.3.1 WIDE ADOPTION OF SIMS IN MATERIAL SCIENCE APPLICATIONS IS LIKELY TO DRIVE THE SEGMENT
7.4 FOCUSED ION BEAM (FIB)
7.4.1 DEMAND FROM NANOFABRICATION AND MICROMACHINING-RELATED APPLICATIONS IS LIKELY TO DRIVE THE FIB SEGMENT
7.5 BROAD ION MILLING (BIM)
7.5.1 HIGH-QUALITY TEM SAMPLING ABILITIES ARE LIKELY TO DRIVE THE DEMAND FOR BIM TECHNOLOGY
7.6 REACTIVE ION ETCHING (RIE)
7.6.1 INCREASED PRODUCT DENSITY, IMPROVED YIELDS, AND TIGHTER TOLERANCES FROM THE ELECTRONICS INDUSTRY ARE LIKELY TO BOOST THE DEMAND FOR REACTIVE ION ETCHING
7.7 SCANNING PROBE MICROSCOPY (SPM)
7.7.1 INCREASED DEMAND FROM SEMICONDUCTORS, MATERIAL SCIENCE, ELECTRONICS, AND NANOTECHNOLOGY FOR TOPOGRAPHIC ANALYSIS TO BOOST THE SPM SEGMENT
7.8 OTHERS
7.9 OVERVIEW OF FAILURE ANALYSIS TECHNIQUES (QUALITATIVE)
7.9.1 DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
7.9.2 FAULT TREE ANALYSIS (FTA)
7.9.3 COMMON-MODE FAILURE ANALYSIS
7.9.4 FAILURE MODES AND EFFECTS ANALYSIS (FMEA)
7.9.5 SNEAK CIRCUIT ANALYSIS
8 FAILURE ANALYSIS MARKET, BY APPLICATION (Page No. – 76)
8.1 INTRODUCTION
8.2 ELECTRONICS & SEMICONDUCTOR
8.2.1 SEMICONDUCTOR MANUFACTURING
8.2.1.1 Increasingly complex circuitry leads to the requirement for failure analysis of different electronic components and devices
8.2.2 MEMS AND THIN FILM PRODUCTION
8.2.2.1 Focused ion beam systems are used for failure analysis of MEMS and identification of root causes of these failures
8.3 INDUSTRIAL SCIENCE
8.3.1 OIL & GAS
8.3.1.1 FIB-SEM systems provide new insights related to the reservoir flow control mechanism for the oil & gas vertical
8.3.2 AUTOMOTIVE AND AEROSPACE
8.3.2.1 Increased demand for electronic systems in autonomous and driverless cars is likely to drive the market for the automotive sector
8.3.3 CHEMICALS
8.3.3.1 Dual beam microscopes carry out the high-fidelity 3D characterization of crystallography, morphology, and chemistry of micro- and submicro-sized features of different components
8.3.4 POWER GENERATION
8.3.4.1 Scanning electron microscope high-resolution imaging is used for the analysis of microstructural changes in power plants
8.4 MATERIAL SCIENCE
8.4.1 METALS AND MINING
8.4.1.1 High adoption of scanning electron microscopes, transmission electron microscopes, and focused ion beam systems to gain an improved understanding of the physical properties of metals
and alloys 83
8.4.2 PAPER AND FIBER MATERIALS
8.4.2.1 Focused ion beam systems provide failure analysis of paper and fiber materials
8.4.3 CERAMIC AND GLASS
8.4.3.1 Focused ion beam systems provide nanofabrication, milling, and imaging of ceramics and glass
8.4.4 POLYMERS
8.4.4.1 High adoption of scanning electron microscopes in modern material science investigations into polymers and plastics is driving the segment
8.4.5 NANOFABRICATION
8.4.5.1 Focused ion beam offers patterning solutions for nanofabrication
8.5 BIOSCIENCE
8.5.1 CELLULAR BIOLOGY
8.5.1.1 Examination of 3D cell and tissue architecture using SEM and TEM is boosting the segment
8.5.2 STRUCTURAL BIOLOGY
8.5.2.1 FIB-SEM systems are being used extensively for studying structural biology
8.5.3 BIOMEDICAL ENGINEERING
8.5.3.1 FIB and TEM systems are aiding research activities for biotechnology and implantable biomedical devices
8.5.4 NEUROSCIENCE
8.5.4.1 3D biological samples imaging is done through FIB-SEM systems
9 FAILURE ANALYSIS MARKET, BY GEOGRAPHY (Page No. – 89)
9.1 INTRODUCTION
9.2 NORTH AMERICA
9.2.1 US
9.2.1.1 Increasing R&D and growing commercialization of nanotechnology-based products are driving the demand for failure analysis in the US
9.2.2 CANADA
9.2.2.1 Initiatives by different institutions, research laboratories, and companies in Canada are driving the market
9.2.3 MEXICO
9.2.3.1 Increasing adoption of advanced technologies in electronics & semiconductor and material science verticals is fueling the demand for failure analysis equipment in Mexico
9.3 EUROPE
9.3.1 GERMANY
9.3.1.1 Favorable funding scenario for R&D in microscopy, growth in the biotechnology industry, and rise in focus on nanotechnology are driving the failure analysis market in Germany
9.3.2 UK
9.3.2.1 Increase in R&D investments in biotechnology, nanotechnology, and life sciences is expected to surge the demand for failure analysis equipment in the UK
9.3.3 FRANCE
9.3.3.1 Growing biotechnology industry is likely to propel the market growth in France
9.3.4 REST OF EUROPE
9.4 ASIA PACIFIC
9.4.1 JAPAN
9.4.1.1 Consistent and increased investments in R&D activities by key players are likely to drive the market in Japan
9.4.2 CHINA
9.4.2.1 Growing demand for failure analysis equipment from electronics & semiconductor, automotive, and other consumer industries is likely to drive the market
9.4.3 SOUTH KOREA
9.4.3.1 Increased adoption of FIB and FIB-SEM systems and solutions in laboratories, universities, and manufacturing companies is contributing to the growth of the market in South Korea
9.4.4 INDIA
9.4.4.1 Increase in government initiatives to support the growth of the electronics & semiconductor industry is likely to drive the market in India
9.4.5 REST OF ASIA PACIFIC
9.5 REST OF THE WORLD (ROW)
9.5.1 MIDDLE EAST & AFRICA
9.5.1.1 Increase in demand for failure analysis equipment from consumer electronics, automotive, and aerospace & defense industries is likely to drive the market in the Middle East & Africa
9.5.2 SOUTH AMERICA
9.5.2.1 Increase in investments in bioscience research is likely to drive the market in South America
10 COMPETITIVE LANDSCAPE (Page No. – 117)
10.1 OVERVIEW
10.2 MARKET PLAYER RANKING ANALYSIS
10.3 COMPETITIVE LEADERSHIP MAPPING
10.3.1 VISIONARY LEADERS
10.3.2 INNOVATORS
10.3.3 DYNAMIC DIFFERENTIATORS
10.3.4 EMERGING COMPANIES
10.4 COMPETITIVE SCENARIO
10.4.1 PRODUCT LAUNCHES AND DEVELOPMENTS
10.4.2 ACQUISITIONS, PARTNERSHIPS, AGREEMENTS, AND COLLABORATIONS
11 COMPANY PROFILES (Page No. – 124)
11.1 KEY PLAYERS
(Business Overview, Products Offered, Recent Developments, SWOT Analysis, and MnM View)*
11.1.1 HITACHI HIGH-TECHNOLOGIES CORPORATION
11.1.2 THERMO FISHER SCIENTIFIC, INC.
11.1.3 CARL ZEISS
11.1.4 JEOL LTD.
11.1.5 TESCAN OSRAY HOLDING
11.1.6 BRUKER
11.1.7 HORIBA, LTD.
11.1.8 SEMILAB
11.1.9 A&D COMPANY LTD.
11.1.10 MOTION X CORPORATION
* Business Overview, Products Offered, Recent Developments, SWOT Analysis, and MnM View might not be captured in case of unlisted companies.
11.2 RIGHT TO WIN
11.3 OTHER KEY PLAYERS
11.3.1 EUROFINS SCIENTIFIC
11.3.2 INTERTEK GROUP PLC
11.3.3 OXFORD INSTRUMENTS
11.3.4 RAITH GMBH
11.3.5 LEICA MICROSYSTEMS
11.3.6 VEECO INSTRUMENTS
11.3.7 ACCU-SCOPE
11.3.8 MEIJI TECHNO CO.
11.3.9 FIBICS
11.3.10 APPLIED BEAMS



★調査レポート[故障解析の世界市場予測:装置別(光学顕微鏡、SEM、TEM、FIB、走査型プローブ顕微鏡、デュアルビーム)、技術別(SIMS、EDX、CMP、FIB、BIM、RIE)、用途別、地域別] ( Failure Analysis Market by Equipment (Optical Microscope, SEM, TEM, FIB, Scanning Probe Microscope, Dual Beam), Technology (SIMS, EDX, CMP, FIB, BIM, RIE), Application, & Geography - Forecast to 2025 / SE 3529) 販売に関する免責事項
[故障解析の世界市場予測:装置別(光学顕微鏡、SEM、TEM、FIB、走査型プローブ顕微鏡、デュアルビーム)、技術別(SIMS、EDX、CMP、FIB、BIM、RIE)、用途別、地域別] ( Failure Analysis Market by Equipment (Optical Microscope, SEM, TEM, FIB, Scanning Probe Microscope, Dual Beam), Technology (SIMS, EDX, CMP, FIB, BIM, RIE), Application, & Geography - Forecast to 2025 / SE 3529) についてEメールでお問い合わせ


◆H&Iグローバルリサーチ株式会社のお客様(例)◆